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The Zeiss Supra 40VP scanning electron microscope provides high resolution surface imaging with three-dimensional appearance. Cryotransfer unit For SEM imaging of fresh, cryofixed tissue in the cryo-mode of the Zeiss Supra 40VP, an Emitech Critical point.

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ZEISS Supra 40VP SEM TF20 High-Resolution EM, CryoEM and CryoET (FEI) T12 Quick CryoEM and CryoET (FEI) T20 iCorr (FEI) High-Res CryoEM and CryoET, Correlative Microscopy JEOL JEM EX Supporting Instruments UC6 cryo-Ultramicrotome.

Equipment

ZEISS Supra 40VP SEM TF20 High-Resolution EM, CryoEM and CryoET (FEI) T12 Quick CryoEM and CryoET (FEI) T20 iCorr (FEI) High-Res CryoEM and CryoET, Correlative Microscopy JEOL JEM EX Supporting Instruments UC6 cryo-Ultramicrotome.

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Scanning electron microscope Zeiss SUPRA 40VP installed in the Interdisciplinary Resource Center for Nanotechnology is equipped with a wide range of additional options that turn a good SEM into unique analytical system. Scanning Electron Microscope Zeiss.

Zeiss Supra 40VP SEM

Zeiss Supra 40VP SEM The Zeiss Supra 40VP scanning electron microscope provides high resolution surface imaging with three-dimensional appearance. It is equipped with a field emission cathode as electron source and three different detectors (SE2, InLens, STEM).

Supplementary Materials for

 · silicon was coated by a thin layer of gold and analyzed by SEM (Zeiss Supra 40VP). Cell proliferation of LNT cells For in vitro cell proliferation, both live cells and LNT cells were suspended in the cell culture medium (DMEM, no phenol red, 10 % FBS) and 8×10.

Life in the Plastisphere : Microbial Communities on Plastic Marine …

Buffalo Grove, IL), then visualized and imaged on a Zeiss Supra 40VP SEM (Carl Zeiss Microscopy, Thornwood, NY). Cell measurements were made from digital images using ImageJ software (Rasband, W.S., ImageJ, U.S. National Institutes of.

Facility and Equipment

Zeiss Supra 40VP field emission scanning electron microscope (SEM) Backscattered electron detectors-AsB and Robinson Secondary electron detectors-Everhart Thornley and InLens Variable pressure analysis of non-conducting and wet specimens.

Equipment

ZEISS Supra 40VP SEM TF20 High-Resolution EM, CryoEM and CryoET (FEI) T12 Quick CryoEM and CryoET (FEI) T20 iCorr (FEI) High-Res CryoEM and CryoET, Correlative Microscopy JEOL JEM EX Supporting Instruments UC6 cryo-Ultramicrotome.

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A Zeiss Supra 40VP field emission scanning electron microscope was employed to examine the morphologies of the prepared samples. Prior to scanning electron microscopy (SEM) examination, the specimens were sputter-coated with gold to avoid charge accumulation.

SUPRA 40 ( Carl Zeiss AG )

 · Microscopy: Electron: SEM: FE The SUPRA™ 40 is a general purpose high resolution FESEM based on the 3rd generation GEMINI® column. Excellent imaging properties combined with analytical capabilities makes this workhorse suitable for a wide range of applications such as materials development, failure analysis, process control, cryo, nanotechnology and analytical applications.

Facility and Equipment

Zeiss Supra 40VP field emission scanning electron microscope (SEM) Backscattered electron detectors-AsB and Robinson Secondary electron detectors-Everhart Thornley and InLens Variable pressure analysis of non-conducting and wet specimens.

ZEISS Supra 40VP SEM used for sale price # > …

This ZEISS Supra 40VP has been sold. Check our Similar Products below, use our Search feature to find more products available for sale or contact us with any questions you might have. Field Emission Scanning Electron Microscope (FE-SEM) Schottky electron source GEMINI Electron optical column Beam booster Hybrid magnetic / Electrostatic objective lens High vacuum and variable pressure up to ….

Instrument: ZEISS Supra 40VP SEM Submitted by: Hoa le Thanh Affiliation: Technical University of Denmark Honorable Mention MNE-HM1- "Lightly Plucked " Description: Buckling of clamped-clamped Nickel beams due to the heating by a red laser. (3″x.

Efficient photocatalytic degradation of dyes using photo …

resolution scanning electron microscopy (SEM) on a ZEISS SUPRA 40VP instrument (Carl ZEISS, Germany) and eld-emission transmission electron microscopy (FE-TEM) on a TALOS F200X (200 keV) instrument (FEI, Netherlands). The TEM instrument was.

Surface

Figure 2-7 Zeiss Supra 40VP SEM where numbers are indicating 1: electron column, 2: sample chamber, and 3: EDS detector. ..... 38 Figure 2-8 FEI Nova ….

ZEISS Supra 40VP SEM, Room B146B Details

 · ZEISS Supra 40VP SEM, Room B146B: User can cancel 4 hours prior to reservation and 100 days after reservation date and time. How far a reservation in the ….

ZEISS SEM, FIB

Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and get images with information about the samples' topography and composition. CSEMs (conventional SEMs with a thermic electron source) and FE-SEMs (field emission SEMs with a field emission electron source) from ZEISS deliver high resolution imaging and superior materials contrast.

Life in the Plastisphere : Microbial Communities on Plastic Marine …

Buffalo Grove, IL), then visualized and imaged on a Zeiss Supra 40VP SEM (Carl Zeiss Microscopy, Thornwood, NY). Cell measurements were made from digital images using ImageJ software (Rasband, W.S., ImageJ, U.S. National Institutes of.

Soft

 · Additional investigations were conducted on gold/palladium-coated samples in a Zeiss Supra 40VP FEG-SEM (2 keV electron energy, 3-5 mm working ….

Surfactant

The dried samples were mounted onto scanning electron microscopy stubs using conductive tape and imaged using ZEISS Supra 40VP SEM (Carl Zeiss AG, Toronto, Canada). The morphology of pNIPAAm microgels was imaged using a Leica DMI B (Leica Microsystems, Buffalo Grove, ….

Hydrogen embrittlement in metals

High resolution SEM (Zeiss Supra 40VP with integrated EBSD system) for detailed analyses of the effect of hydrogen on fracture behavior Laboratory and on-location x-ray diffractometer to determine phase composition, texture and residual stress of crystalline.

Surface

Figure 2-7 Zeiss Supra 40VP SEM where numbers are indicating 1: electron column, 2: sample chamber, and 3: EDS detector. ..... 38 Figure 2-8 FEI Nova ….